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Ellipsometry is an
optical technique for
investigating the
dielectric properties (complex
refractive index or
dielectric function) of thin films. Ellipsometry...
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ellipsometry relies on reflection, it is not
required for the
sample to be
transparent to
light or for its back side to be accessible.
Ellipsometry can...
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nontrivial scattering problems,
which find
applications in magneto-optics. In
ellipsometry, Kramer-Kronig
relations are
applied to
verify the
measured values for...
- (2018). "The
direct bandgap of gray α-tin
investigated by
infrared ellipsometry".
Applied Physics Letters. 113 (23): 232104. Bibcode:2018ApPhL.113w2104C...
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polarimetry of
astronomical objects, strain-induced birefringence, and
ellipsometry.
Later developers of the
photoelastic modulator include J.C Kemp, S.N...
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Center for
Materials and Nanoscience. He is a
specialist in
spectroscopic ellipsometry and has
contributed to the
development of blue and
white LED, fast processors...
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thickness of the thin-film.
Ellipsometry is a
technique that is
often used to
measure properties of thin films. In a
typical ellipsometry experiment polarized...
- X-rays and is
related to the
techniques of
neutron reflectometry and
ellipsometry. The
basic principle of X-ray
reflectivity is to
reflect a beam of X-rays...
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surface which is
capable of
achieving ultralow fouling (<5 ng/cm2).
Ellipsometry, a form of
sensitive polarized optical spectroscopy,
allows for the measurement...
- Company, an
ellipsometry company based in Lincoln, Nebraska, and a
world leader in the research, development, and
commercialization of
ellipsometry instruments...
