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Ellipsometry is an
optical technique for
investigating the
dielectric properties (complex
refractive index or
dielectric function) of thin films. Ellipsometry...
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ellipsometry relies on reflection, it is not
required for the
sample to be
transparent to
light or for its back side to be accessible.
Ellipsometry can...
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nontrivial scattering problems,
which find
applications in magneto-optics. In
ellipsometry, Kramer-Kronig
relations are
applied to
verify the
measured values for...
-
research interests included optical waveguides,
optical waveguide sensing,
ellipsometry, dye-sensitized
solar cells, and OLEDs. He was
still research-active...
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Brandenburg Alma mater
University of Göttingen Known for
Drude model Ellipsometry Optical rotatory dispersion Scientific career Fields Physicist Institutions...
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change in
polarization state using such an
apparatus is the
basis of
ellipsometry, by
which the
optical properties of
specular surfaces can be
gauged through...
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thickness of the thin-film.
Ellipsometry is a
technique that is
often used to
measure properties of thin films. In a
typical ellipsometry experiment polarized...
-
refractive index of InP and its
oxide measured by multiple-angle
incident ellipsometry",
Journal of
Materials Science Letters, 12 (10): 721, doi:10.1007/BF00626698...
-
various processing steps. For example, thin film
metrology based on
ellipsometry or
reflectometry is used to
tightly control the
thickness of gate oxide...
- {SiO2}
determined by
vacuum ultraviolet spectroscopy and
spectroscopic ellipsometry" (PDF).
Physical Review B. 72 (20): 205117. Bibcode:2005PhRvB..72t5117T...
